Webbläsaren som du använder stöds inte av denna webbplats. Alla versioner av Internet Explorer stöds inte längre, av oss eller Microsoft (läs mer här: * https://www.microsoft.com/en-us/microsoft-365/windows/end-of-ie-support).

Var god och använd en modern webbläsare för att ta del av denna webbplats, som t.ex. nyaste versioner av Edge, Chrome, Firefox eller Safari osv.

Fredrik Edman. Fotograf Johan Persson.

Fredrik Edman

Patentrådgivare

Fredrik Edman. Fotograf Johan Persson.

High precision measurements using high frequency gigahertz signals

Författare

  • Aohan Jin
  • Siyuan Fu
  • Atsunori Sakurai
  • Liang Liu
  • Fredrik Edman
  • Tönu Pullerits
  • Viktor Öwall
  • Khadga Jung Karki

Summary, in English

Generalized lock-in amplifiers use digital cavities with Q-factors as high as 5 × 108 to measure signals with very high precision. In this Note, we show that generalized lock-in amplifiers can be used to analyze microwave (giga-hertz) signals with a precision of few tens of hertz. We propose that the physical changes in the medium of propagation can be measured precisely by the ultra-high precision measurement of the signal. We provide evidence to our proposition by verifying the Newton's law of cooling by measuring the effect of change in temperature on the phase and amplitude of the signals propagating through two calibrated cables. The technique could be used to precisely measure different physical properties of the propagation medium, for example, the change in length, resistance, etc. Real time implementation of the technique can open up new methodologies of in situ virtual metrology in material design.

Avdelning/ar

  • Kemisk fysik
  • Institutionen för elektro- och informationsteknik
  • ELLIIT: the Linköping-Lund initiative on IT and mobile communication

Publiceringsår

2014

Språk

Engelska

Publikation/Tidskrift/Serie

Review of Scientific Instruments

Volym

85

Issue

12

Dokumenttyp

Artikel i tidskrift

Förlag

American Institute of Physics (AIP)

Ämne

  • Electrical Engineering, Electronic Engineering, Information Engineering
  • Atom and Molecular Physics and Optics

Status

Published

ISBN/ISSN/Övrigt

  • ISSN: 1089-7623